Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10″ in diameter and 6″ in height.
The Multi Height Microposition Probe has a removeable X-Y stage which provides the sample size versatility of the Multi Height Probe and the high tip placement accuracy of the Microposition Probe. Four screws can be removed to take off the X-Y sample stage, essentially turning the Multi Height Microposition Probe into a Multi Height Probe. The X-Y stage is the same type as is used on the Microposition Probe.
Features:
- Precision ball-bearing X-Y-theta stage with micrometer adjustments
- 25 mm x 25 mm X-Y stage travel
- Sample holder for materials up to 76 mm in diameter
- Samples can be held by vacuum if necessary
- Lever operated probe with switched current leads to prevent sparking
- Optional probe head shroud to shield light from any sample up to 2″ diameter
- X-Y stage can be removed to provide a large flat area for probing materials samples, ingots, and wafers of widely varying dimensions
- Locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height
- Plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc
- Smooth base for positioning samples
- Includes one Jandel Cylindrical probe head
Application:
Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10″ in diameter and 6″ in height. An optional probe head shroud shields light from any sample up to 2″ diameter.
Downloads
System Configurations
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Multi Height Microposition Probe with RM3000 Test Unit |
Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 219-9007 or send e-mail to Joshua Bridge at: sales@bridgetec.com
