The unit comprises a hard anodised aluminium alloy plate 8mm thick with a vertical column, on which is mounted a Jandel cylindrical probe with a raising and lowering mechanism.
- Allows probing of wafers, ingots, or samples of widely varying dimensions
- Locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height
- Plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc
- Smooth base for positioning samples
- Includes one Jandel Cylindrical probe head
 Multi Height Probe shown probing an ingot(Click image for larger view) |
 Multi Height Probe shown probing an 8″ wafer(Click image for larger view) |
Application
Measurement of resistivity of samples by the four point technique. From wafers to ingots up to 10″ deep by 6″ high. Width is limited only by need to support the ends.
Construction
The unit comprises a hard anodised aluminium alloy plate 8mm thick with a vertical column, on which is mounted a Jandel cylindrical probe with a raising and lowering mechanism. You can slide this assembly up or down the column and clamp it in position. If desired an adjustable micro-switch enables an interlock to operate prevent sparking when the probe is lowered onto the specimen.
The connection to a measuring system is made via a 9-way socket on the raising and lowering assembly. The probe head can be changed by releasing a single clamp screw and unplugging from a 5-way socket. The probe head / lead is identical to that used on the Jandel Multiposition probe.
Downloads
System Configurations
 |
Multi Height Probe with RM3000 Test Unit |
 |
Multi Height Probe with HM21 Hand Held Meter |
Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 219-9007 or send e-mail to Joshua Bridge at: sales@bridgetec.com
