Products

Multiposition Wafer Probe for the Measurement of Wafer Resistivity

The instrument comprises a white powder-paint coated metal base carrying a Delrin column supporting the vertical slide, operating lever shaft, and micro-switch. The vertical slide carries the probe head, secured by a clamp screw.

Multi Height Four-Point Probe Stand

The unit comprises a hard anodised aluminium alloy plate 8mm thick with a vertical column, on which is mounted a Jandel cylindrical probe with a raising and lowering mechanism.

Jandel Microposition Probe Stand

Ideal for probing small samples where high placement accuracy is required. An optional probe head shroud shields light from any sample up to 2″ diameter.

Multi Height Microposition Probe

Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10″ in diameter and 6″ in height.

Universal Probe

The probe guidance system is kinematic and thus free of all lateral play. The needles are positioned by upper and lower jeweled guides, each needle being constrained by a spring-loaded ruby ball at each guide.

Hand Applied Four-Point Probe

A four-point resistivity probe that can be hand-held and applied, incorporating a Jandel cylindrical probe head.

Jandel Engineering Four Point Probe Systems
	1. Multiposition Wafer Probe with RM3000+ Test Unit
	2. Multiposition Wafer Probe with ResTest Meter
	3. Multiposition Wafer Probe with HM21 Hand Held Meter
	4. Multi Height Probe + RM3000+ Four Point Probe Test Unit
	5. Multi Height Probe with ResTest Meter
	6. Multi Height Probe with HM21 Hand Held Meter
	7. Multi Height Microposition Probe with RM3000+ Test Unit
	8. Multi Height Microposition Probe with ResTest Meter
	9. Universal Probe with RM3000+ Test Unit
	10. Universal Probe with ResTest Meter
	11. Hand Applied Probe with RM3000+ Test Unit
	12. Hand Applied Probe with ResTest Meter
	13. Hand Applied Probe with HM21 Hand Held Meter Portable System
	14. CYL-RM3000+ Four Point Probe System
	15. Cylindrical Probe Head with ResTest Meter
	16. CYL-HM21 Four Point Probe
	17. SRM Probe Head with RM3000+ Test Unit
	18. SRM Probe Head with ResTest Meter
	19. SRM Probe Head with HM21-SRM Hand Held Meter for Bulk Resistivity Measurements
	20. SRM Probe Head with HM21-SRM Hand Held Meter for General Purpose Use
Jandel Engineering System Accessories
	21. Jandel Light Shrouds
	22. Reference Sample
	23. Cylindrical Probe Head
SRM-232 Four Point Probes
	25. SRM-232 Four Point Probe
	26. SRM Probe Head Information (PDF file)
	27. SRM-232 Calibration Fixture Information (PDF file)
Ecopia Hall Effect Measurement Systems
	28. Ecopia HMS-3000 Hall Measurement System
	29. Ecopia HMS-5000 Variable Temperature Hall Effect Measurement System
	30. Ecopia HMS-7000 Photonic Hall Effect Measurement System
Four Point Probe Individual Components, Measurement Electronics and Probe Units
	31. RM3000+ Test Unit
	32. ResTest Meter
	33. HM21 Hand Held Meter
	34. Multiposition Wafer Probe
	35. Multi Height Probe
	36. Microposition Probe
	37. Multi Height Microposition Probe
	38. Universal Four-Point Probe
	39. Hand-Applied Four-Point Probe
	40. SRM Probe Head
Four Point Probe Heads For All Known Systems
	41. All Four Point Probe Heads
	42. Probes for Prometrix, KLA/Tencor, & CDE
	43. Cylindrical Probe Head
	44. Four Pin Probe Head
	45. Cartridge with Lead Probe Head
	46. Compact Probe Head
	47. Miniature Cartridge Probe Head
	48. Miniature Cartridge with 6-32 Tapped Holes Probe Head
	49. High / Low Temperature Four Point Probe Head
	50. Vacuum Chamber Four Point Probe Head
	51. Unusual FIVE Point Probes
	52. Close Needle Spacing Probes

Multiposition Wafer Probe for the Measurement of Wafer Resistivity

Multi Height Four-Point Probe Stand

Jandel Microposition Probe Stand

Multi Height Microposition Probe

Universal Probe

Hand Applied Four-Point Probe

All Products