Tel: (480) 988-2256 Fax: (480) 452-0172

Multi Height Microposition Probe

Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10″ in diameter and 6″ in height.

Jandel Multi Height Microposition Probe

The Multi Height Microposition Probe has a removeable X-Y stage which provides the sample size versatility of the Multi Height Probe and the high tip placement accuracy of the Microposition Probe. Four screws can be removed to take off the X-Y sample stage, essentially turning the Multi Height Microposition Probe into a Multi Height Probe. The X-Y stage is the same type as is used on the Microposition Probe.

Features:

  • Precision ball-bearing X-Y-theta stage with micrometer adjustments
  • 25 mm x 25 mm X-Y stage travel
  • Sample holder for materials up to 76 mm in diameter
  • Samples can be held by vacuum if necessary
  • Lever operated probe with switched current leads to prevent sparking
  • Optional probe head shroud to shield light from any sample up to 2″ diameter
  • X-Y stage can be removed to provide a large flat area for probing materials samples, ingots, and wafers of widely varying dimensions
  • Locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height
  • Plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc
  • Smooth base for positioning samples
  • Includes one Jandel Cylindrical probe head

Application:

Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10″ in diameter and 6″ in height. An optional probe head shroud shields light from any sample up to 2″ diameter.

 


Downloads

A document regarding the Jandel Multi Height Microposition Probe (45K PDF file) A document regarding the Jandel Multi Height Microposition Probe (45K PDF file)
Images of the Multi Height Microposition Probe (324K PDF file) Images of the Multi Height Microposition Probe (324K PDF file)
A document regarding the light shroud (the 'Large Shroud') available for the Jandel Multi Height Microposition Probe for use in blocking light from sample up to 2' in diameter (150K PDF file) A document regarding the light shroud (the "Large Shroud") available for the Jandel Multi Height Microposition Probe for use in blocking light from sample up to 2" in diameter (150K PDF file)

 


System Configurations

Multi Height Microposition Probe with RM3000 Test Unit Multi Height Microposition Probe with RM3000 Test Unit

 


Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com