|
|
||||||||||||||
|
|
||||||||||||||
|
|
||||||||||||||
|
|
||||||||||||||
|
|
||||||||||||||
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other materials and conductive coatings.
Tel: (480) 219-9007
System Configurations
- Jandel General Purpose Manual Four Point Probing System
- Jandel Multi Purpose Manual Four Point Probing System
- Jandel Four Point Probing System for Wafers
- Jandel Universal Four Point Probing System Specialty Four Point Probing System
- Jandel Portable Four Point Probing System
- Jandel Portable Four Point Probing System for Measuring Silicon Pot Scrap, Ingots, and Remelt
- All System Configurations for Four Point Probes and Hall Measurement Systems
- Jandel Four Point Probe Heads for All Known Systems
- SRM-232 Sheet Resistance Meter
- Ecopia HMS-3000 Hall Effect Measurement System
- Ecopia HMS-5000 Hall Effect Measurement System
Technical Information
- Short Application Note on Sheet Resistance, Ohms-Per-Square, and the Calculation of Resistivity or Thickness
- Basic information regarding how to make four point probe measurements using Jandel resistivity test equipment.
- Four Point Probe Theory - A helpful article
- Four Point Probe Equations - A helpful article from the University of Illinois - Urbana/Champaign
- Understanding volume resistivity measurements and converting between ohms-per-square (sheet resistance) and ohms-cm (volume resistivity)
- Sample Size Requirements and Correction Factors Some questions and answers from Jandel Engineering Ltd.
- Haldor Topsoe Technical Documents Regarding Correction Factors Correction Factor for various material shapes and sizes
- 1964 National Bureau of Standards Technical Note 199,"Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples"
- Finite-Size Corrections for 4-Point Probe Measurements, by J. R. Senna, Instituto Nacional de Pesquisas Espaciais (INPE), Brasil
- Questions and answers re: resistivity & resistance, sheet resistance, volume resistivity, surface resistivity by John Clark of Jandel Engineering
- Q & A regarding the use of Jandel Resistivity Measurement equipment by Pete Clark of Jandel Engineering
- Four-Point Probe Theory of Operation from the University of California, Berkeley, EECS web site (PDF file)
- A table of suggested probe tip specifications for various silicon wafer types.
- A table of common four point probe tip radii and spacings
- Osmium alloy tips versus tungsten carbide tips
- Square array versus linear array four point probe
- Reversing current to check the validity of a 4 point probe measurement
- Determining the best choice of probe tip specifications (tip spacing, spring loads, material, radii) for a given material.
- What is the expected life of a Jandel Four Point Probe Head?
- Jandel FAQ
- Wikipedia article regarding the Hall Effect
- Wikipedia article regarding the Van der Pauw method
- 23 NIST web page regarding the theory & implementation of the Hall Effect Measurement technique
| To request further information or to place an order, please contact Joshua Bridge at Bridge Technology in the USA at: (Voice) 480-219-9007, Email: sales@bridgetec.com |  |
HOME | PRODUCTS | TECH INFO | FAQ | ABOUT | CONTACT COPYRIGHT © 2020 FOUR-POINT-PROBES. POWERED BY BRIDGE TECHNOLOGY. |