The Multiposition Wafer Probe combined with the RM3000+ Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multiposition Wafer Probe with ResTest Meter
The Multiposition Wafer Probe combined with the ResTest Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multiposition Wafer Probe with HM21 Hand Held Meter
The Multiposition Wafer Probe combined with the HM21 Hand Held Meter Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Jandel CYL-RM3000+ Four Point Probe System
General purpose portable Four Point Probing System for measuring sheet resistance or volume resistivity. This system includes the Jandel Cylindrical Probe along with the RM3000+ Test Unit.
Jandel CYL-ResTest Four Point Probe System
Four Point Probing System for measuring sheet resistance or volume resistivity. This system includes the Jandel Cylindrical Probe along with the ResTest Test Unit.
Jandel CYL-HM21 Four Point Probe
The Jandel CYL-HM21 is a general purpose portable four point probing system for measuring sheet resistance or volume resistivity.
