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Four-Point Probes for a Broad Range of Resistivity Measurement Applications.
Click Photo Below for More Information Jandel Manual Four Point Probing Equipment A complete resistivity test system is made by combining the RM3-AR Test Unit (listed directly below) with any of the following six probe units. The HM21 can be used as the electronics in a portable four point probing system, or as the electronics for one of the following six probe units. The RM3-AR Test Unit has greater range than the HM21. Suggested system configurations are shown at the TOP of the the column to the right =====>   RM3-AR Test Unit (Electronics) Combined current source and meter in one unit designed especially for the four point probe measurement.   Multiposition Wafer Probe Manually probe 1 to 9 pre-set locations on wafers up to 8" in diameter with 1mm repeatability.   Multi-Height 4 Point Probe Easily adjusts for probing materials of varying dimensions such as large substrates, ingots, wafers   Microposition Probe Ideal for sample up to 76mm (3") diameter requiring high probe placement accuracy.   Multi Height Microposition Probe Removeable X-Y stage to provide both sample size versatility and high tip placement accuracy   Universal Probe Versatile research unit for wafers and substrates up to 76mm (3") in diameter   Hand Applied 4 Point Probe Manually probe large flat panels, ingots, etc.   HM21 Hand Held Meter Hand held four point probe souce-meter with optional probe.   P-N Typing Unit Use the Jandel P-N Typing Unit with any four point probe to determine whether a wafer is P or N type.	Jandel Four Point Probe System Configurations: Manual Wafer Mapping Four Point Probing System Multiposition Wafer Probe + RM3-AR Test Unit General Purpose Four Point Probing System Multi Height Probe + RM3-AR Test Unit Multi Purpose Four Point Probing System Multi Height Microposition Probe + RM3-AR Test Unit Portable Four Point Probing System Hand Applied Probe + HM21 Hand Held Meter Portable Four Point Probing System for measuring potscrap, silicon tops and tails, ingots. HM21-SRM Click Photo Below for More Information Jandel Four Point Probe Heads for All Known Systems   Prometrix, KLA/Tencor, & CDE Probes Probe heads for Prometrix, KLA/Tencor, and CDE systems. Full range of specs available including close space probes (20 mil spacing).   Probes for ALL other systems High quality probe heads for all known systems. Jeweled Needle Guides, Rebuildable to "as new" condition, Unsurpassed quality. Specialty Four Point Probe Heads   High/Low Temperature 4 Pt Probes   Vacuum Chamber 4 Pt Probes   Square Array (Hall) 4 Pt Probes   Unusual FIVE Point Probes   Close Needle Spacing Probes Download the Jandel Products Brochure (855K PDF FILE)	Click Photo Below for More Information Ecopia HMS-3000 Hall Effect Measurement System The Ecopia HMS-3000 Hall Effect Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors. The system can be used to characterize various material including silicon and compound semiconductors. Competitively Priced Compact Desktop Design Easy-To-Use Constant current source supply system Sample measurement case 0.55T Permanent magnet set I-V Curve Capability Windows Software 77K and 300K temperature testing Low and high resistivity measurement capability, bulk and sheet carrier concentration and mobility, Hall coefficient, DC measurement modes, van der Pauw and Hall Bar measurements, P-N typing, Maximum sample size (Small board) - 6mm x 6mm, (Large Board) - 20mm x 20mm. Measurement Material: All semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured). One of the popular Spring Clip Sample Mounting Boards is included with the HMS-3000 Hall Effect Measurement System: SPCB-1
Click Photo Below for More Information Lucas Labs Manual Four Point Probe with Computer Controlled Data Acquisition System  Manual Four Point Probe  Computer Controlled Data Acquisition  Fully Featured Windows Software	Click Photo Below for More Information Signatone Thin Film Resistivity Wafer Mapping System for wafers up to 300 mm   Auto Stepping   Available with Cassette-to-Cassette   Fully Featured Windows Software   Signatone Reliability & Quality	Click Photo Below for More Information SRM-232 Sheet Resistance Meter Low Cost Four Point Probe with Meter Available in Four Measurement Ranges   127 internal data point storage capability   RS-232 interface for remote data transfer SRM-232-10 Range: 0.000 to 9.999 ohms/square. SRM-232-100 Range: 00.00 to 95.00 ohms/square. SRM-232-1000 Range: 0 to 1000 ohms/square. SRM-232-2000 Range: 0 to 2000 ohms/square.
Four Point Probe Technical Information Click on the links below for information about the four point probe measurement 1 Short Application Note on Sheet Resistance, Ohms-Per-Square, and the Calculation of Resistivity or Thickness 2 Basic information regarding how to make four point probe measurements using Jandel resistivity test equipment. 3 Four Point Probe Theory - A helpful article from the University of Illinois - Urbana/Champaign 4 Four Point Probe Equations - A helpful article from the University of Illinois - Urbana/Champaign 5 Converting Ohms-per-square to Ohms-cm Converting sheet resistance measurements to values expressed as bulk resistivity 6 Sample Size Requirements and Correction Factors Some questions and answers from Jandel Engineering Ltd. 7 Haldor Topsoe Technical Documents Regarding Correction Factors Correction Factor for various material shapes and sizes. 8 [6 MEG FILE] National Bureau of Standards Technical Note 199, Issued April 15, 1964, "Correction Factor Tables for Four-Point Probe Resistivity     Measurements On Thin, Circular Semiconductor Samples  [6068K PDF file] 9 Finite-Size Corrections for 4-Point Probe Measurements, by J. R. Senna of the Instituto Nacional de Pesquisas Espaciais (INPE), Brasil 10 Q & A regarding: resistivity & resistance, surface resistivity, sheet resistance & volume resistivity by John Clark of Jandel Engineering 11 Q & A regarding the use of Jandel Resistivity Measurement equipment by Pete Clark of Jandel Engineering 12 Four-Point Probe Theory of Operation from the University of California, Berkeley, EECS web site (PDF file). 13 A table of suggested probe tip specifications for various silicon wafer types. 14 A table of common four point probe tip radii and spacings 15 The use of osmium alloy four point probe tips versus the more common tungsten carbide tips 16 Square array versus linear array four point probe 17 Jandel FAQ 18 Application note regarding Jandel Cylindrical probe, which applies to most Jandel probe heads 19 Four point probe nostalgia

Four-Point-Probes is a division of Bridge Technology. To request further information or to place an order, please contact Larry Bridge at Bridge Technology in the USA at: (Voice) 480-988-2256, Email: sales@bridgetec.com  or Fax: 480-452-0172