Bridge Technology since 1995
Four-Point-Probes
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Four-Point Probes for a Broad Range of Resistivity Measurement Applications.
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Jandel
Manual Four Point Probing Equipment

Jandel RM3 Test Equipment
A complete resistivity test system is made by combining the RM3-AR Test Unit (listed directly below) with any of the following six probe units. The HM21 can be used as the electronics in a portable four point probing system, or as the electronics for one of the following six probe units. The RM3-AR Test Unit has greater range than the HM21. Suggested system configurations are shown at the TOP of the the column to the right =====>

click here for more information  RM3-AR Test Unit (Electronics)
Combined current source and meter in one unit designed especially for the four point probe measurement.
click here for more information  Multiposition Wafer Probe
Manually probe 1 to 9 pre-set locations on wafers up to 8" in diameter with 1mm repeatability.
click here for more information  Multi-Height 4 Point Probe
Easily adjusts for probing materials of varying dimensions such as large substrates, ingots, wafers
click here for more information  Microposition Probe
Ideal for sample up to 76mm (3") diameter requiring high probe placement accuracy.

click here for more information  Multi Height Microposition Probe
Removeable X-Y stage to provide both sample size versatility and high tip placement accuracy

click here for more information  Universal Probe
Versatile research unit for wafers and substrates up to 76mm (3") in diameter

click here for more information  Hand Applied 4 Point Probe
Manually probe large flat panels, ingots, etc.
click here for more information  HM21 Hand Held Meter
Hand held four point probe souce-meter with optional probe.
click here for more information  P-N Typing Unit
Use the Jandel P-N Typing Unit with any four point probe to determine whether a wafer is P or N type.


Jandel Four Point Probe System Configurations:
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Jandel
Four Point Probe Heads for All Known Systems

Jandel four point probe heads for all known systems

click here for more information  Prometrix, KLA/Tencor, & CDE Probes
Probe heads for Prometrix, KLA/Tencor, and CDE systems. Full range of specs available including close space probes (20 mil spacing).

click here for more information  Probes for ALL other systems
High quality probe heads for all known systems. Jeweled Needle Guides, Rebuildable to "as new" condition, Unsurpassed quality.

Specialty Four Point Probe Heads
click here for more information  High/Low Temperature 4 Pt Probes
click here for more information  Vacuum Chamber 4 Pt Probes
click here for more information  Square Array (Hall) 4 Pt Probes
click here for more information  Unusual FIVE Point Probes
click here for more information  Close Needle Spacing Probes


Download the Jandel Products
Brochure (855K PDF FILE)
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Ecopia HMS-3000 Hall Effect Measurement System

Ecopia HMS-3000 Hall Effect Measurement System

The Ecopia HMS-3000 Hall Effect Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors. The system can be used to characterize various material including silicon and compound semiconductors.
  • Competitively Priced
  • Compact Desktop Design
  • Easy-To-Use
  • Constant current source supply system
  • Sample measurement case
  • 0.55T Permanent magnet set
  • I-V Curve Capability
  • Windows Software
  • 77K and 300K temperature testing
  • Low and high resistivity measurement capability, bulk and sheet carrier concentration and mobility, Hall coefficient, DC measurement modes, van der Pauw and Hall Bar measurements, P-N typing,
  • Maximum sample size (Small board) - 6mm x 6mm, (Large Board) - 20mm x 20mm.
  • Measurement Material: All semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured).

    One of the popular Spring Clip Sample Mounting Boards is included with the HMS-3000 Hall Effect Measurement System:
    SPCB-1







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    Lucas Labs
    Manual Four Point Probe with Computer Controlled Data Acquisition System


    Lucas Labs Pro4 Resistivity Test System

    click here for more information Manual Four Point Probe
    click here for more information Computer Controlled Data Acquisition
    click here for more information Fully Featured Windows Software






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    Signatone
    Thin Film Resistivity Wafer Mapping System
    for wafers up to 300 mm


    Signatone Resistivity Mapping System

    click here for more information  Auto Stepping
    click here for more information  Available with Cassette-to-Cassette
    click here for more information  Fully Featured Windows Software
    click here for more information  Signatone Reliability & Quality





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    SRM-232 Sheet Resistance Meter
    Low Cost Four Point Probe with Meter

    Surface Resistivity Meter
    Available in Four Measurement Ranges
    click here for more information  127 internal data point storage capability
    click here for more information  RS-232 interface for remote data transfer
  • SRM-232-10
    Range: 0.000 to 9.999 ohms/square.
  • SRM-232-100
    Range: 00.00 to 95.00 ohms/square.
  • SRM-232-1000
    Range: 0 to 1000 ohms/square.
  • SRM-232-2000
    Range: 0 to 2000 ohms/square.


  • Four Point Probe Technical Information
    Click on the links below for information about the four point probe measurement


    click here for more information 1 Short Application Note on Sheet Resistance, Ohms-Per-Square, and the Calculation of Resistivity or Thickness
    click here for more information 2 Basic information regarding how to make four point probe measurements using Jandel resistivity test equipment.
    click here for more information 3 Four Point Probe Theory - A helpful article from the University of Illinois - Urbana/Champaign
    click here for more information 4 Four Point Probe Equations - A helpful article from the University of Illinois - Urbana/Champaign
    click here for more information 5 Converting Ohms-per-square to Ohms-cm Converting sheet resistance measurements to values expressed as bulk resistivity
    click here for more information 6 Sample Size Requirements and Correction Factors Some questions and answers from Jandel Engineering Ltd.
    click here for more information 7 Haldor Topsoe Technical Documents Regarding Correction Factors Correction Factor for various material shapes and sizes.
    click here for more information 8 [6 MEG FILE] National Bureau of Standards Technical Note 199, Issued April 15, 1964, "Correction Factor Tables for Four-Point Probe Resistivity
        Measurements On Thin, Circular Semiconductor Samples  [6068K PDF file]
    click here for more information 9 Finite-Size Corrections for 4-Point Probe Measurements, by J. R. Senna of the Instituto Nacional de Pesquisas Espaciais (INPE), Brasil
    click here for more information 10 Q & A regarding: resistivity & resistance, surface resistivity, sheet resistance & volume resistivity by John Clark of Jandel Engineering
    click here for more information 11 Q & A regarding the use of Jandel Resistivity Measurement equipment by Pete Clark of Jandel Engineering
    click here for more information 12 Four-Point Probe Theory of Operation from the University of California, Berkeley, EECS web site (PDF file).
    click here for more information 13 A table of suggested probe tip specifications for various silicon wafer types.
    click here for more information 14 A table of common four point probe tip radii and spacings
    click here for more information 15 The use of osmium alloy four point probe tips versus the more common tungsten carbide tips
    click here for more information 16 Square array versus linear array four point probe
    click here for more information 17 Jandel FAQ
    click here for more information 18 Application note regarding Jandel Cylindrical probe, which applies to most Jandel probe heads
    click here for more information 19 Four point probe nostalgia

    Four-Point-Probes is a division of Bridge Technology. To request further information or to place an order, please contact Larry Bridge at Bridge Technology in the USA at: (Voice) 480-988-2256, Email: sales@bridgetec.com  or Fax: 480-452-0172
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