The Cylindrical probe is the standard probe used in several OEM wafer mapping systems and it is ideal for building into custom engineered four point probe systems. It is available in a special Hi Vac version which has modifications for use in a vacuum chamber.
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other materials and conductive coatings.
| To request further information or to place an order, please contact Joshua Bridge at Bridge Technology in the USA at: (Voice) 480-219-9007, Email: sales@bridgetec.com |  |
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