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SRM-RM3000+ Four Point Probing System

The SRM probe is a lower cost plastic bodied probe that is suitable for use in measuring a wide range of materials including various conductive coatings, ITO on glass, silicon wafers, ingots, potscrap, conductive paints, and various thin films.

SRM Probe Head with ResTest Meter

The Jandel ResTest Test Unit with SRM Probe Head can accurately measure silicon tops and tails, potscrap, ingots, and homogeneous silicon wafers.

HM21-SRM Hand Held Meter with SRM Probe Head

The Jandel HM21-SRM Hand Held Meter with SRM Probe Head can accurately measure silicon tops and tails, potscrap, ingots, and homogeneous silicon wafers.