The Multiposition Wafer Probe combined with the RM3000+ Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multiposition Wafer Probe with HM21 Hand Held Meter
The Multiposition Wafer Probe combined with the HM21 Hand Held Meter Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multi Height Probe with RM3000+ Test Unit
The Multi Height Probe combined with the RM3000+ Test Unit is our most popular combination for use in measuring a wide range of materials and sample sizes.
Multi Height Probe with ResTest Meter
The Multi Height Probe combined with the ResTest Test Unit is a great system for use in measuring a wide range of materials and sample sizes when the greater measurement range of the RM3000 Test Unit is not necessary.
Multi Height Microposition Probe with RM3000+ Test Unit
The Multi Height Microposition Probe combined with the RM3000+ Test Unit is Jandel’s most versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10″ x 10″, or […]
Multi Height Microposition Probe with ResTest Meter
The Multi Height Microposition Probe combined with the ResTest Test Unit is a versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10″ x 10″, or tall […]
