The SRM probe is a lower cost plastic bodied probe that is suitable for use in measuring a wide range of materials including various conductive coatings, ITO on glass, silicon wafers, ingots, potscrap, conductive paints, and various thin films.
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other materials and conductive coatings.