The Multiposition Wafer Probe combined with the ResTest Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other materials and conductive coatings.
| To request further information or to place an order, please contact Joshua Bridge at Bridge Technology in the USA at: (Voice) 480-219-9007, Email: sales@bridgetec.com |  |
HOME | PRODUCTS | TECH INFO | FAQ | ABOUT | CONTACT COPYRIGHT © 2020 FOUR-POINT-PROBES. POWERED BY BRIDGE TECHNOLOGY. |