Jandel CT6 Four Point Probe Heads for use with Prometrix (KLA/Tencor) and CDE (Creative Design Engineering) Resistivity Mapping Systems.
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other materials and conductive coatings.