The Multiposition Wafer Probe combined with the RM3000+ Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multi Height Probe with RM3000+ Test Unit
The Multi Height Probe combined with the RM3000+ Test Unit is our most popular combination for use in measuring a wide range of materials and sample sizes.
Multi Height Microposition Probe with RM3000+ Test Unit
The Multi Height Microposition Probe combined with the RM3000+ Test Unit is Jandel’s most versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10″ x 10″, or […]
Universal Probe with RM3000+ Test Unit
The Universal Probe combined with the RM3000+ Test Unit is a unique system for general purpose use as well as for certain special applications.
RM3000+ Test Unit with PC Software
The RM3000+ Test Unit is a specialty electronics instruments designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement.
