The Multiposition Wafer Probe combined with the ResTest Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multi Height Microposition Probe with ResTest Meter
The Multi Height Microposition Probe combined with the ResTest Test Unit is a versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10″ x 10″, or tall […]
Universal Probe with ResTest Meter
The Universal Probe combined with the ResTest Test Unit is a unique system for general purpose use as well as for certain special applications.
Hand Applied Probe with ResTest Meter
The Hand Applied Probe combined with the ResTest Meter is a high quality four point probe measurement system which incorporates the Jandel Cylindrical probe head. The system can be used to measure a wide range of materials with varying shapes and sizes.
SRM Probe Head with ResTest Meter
The Jandel ResTest Test Unit with SRM Probe Head can accurately measure silicon tops and tails, potscrap, ingots, and homogeneous silicon wafers.
Jandel ResTest Meter
The Jandel ResTest Meter is a specialty electronics instrument designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement.
