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Multiposition Wafer Probe with RM3000+ Test Unit

The Multiposition Wafer Probe combined with the RM3000+ Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.

Multiposition Wafer Probe with ResTest Meter

The Multiposition Wafer Probe combined with the ResTest Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.

Multiposition Wafer Probe with HM21 Hand Held Meter

The Multiposition Wafer Probe combined with the HM21 Hand Held Meter Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.

Multiposition Wafer Probe for the Measurement of Wafer Resistivity

The instrument comprises a white powder-paint coated metal base carrying a Delrin column supporting the vertical slide, operating lever shaft, and micro-switch. The vertical slide carries the probe head, secured by a clamp screw.