The Multi Height Microposition Probe combined with the RM3000+ Test Unit is Jandel’s most versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10″ x 10″, or […]
Multi Height Microposition Probe
Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10″ in diameter and 6″ in height.
