The Multiposition Wafer Probe combined with the ResTest Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter.
Multi Height Microposition Probe with ResTest Meter
The Multi Height Microposition Probe combined with the ResTest Test Unit is a versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10″ x 10″, or tall […]
Jandel CYL-HM21 Four Point Probe
The Jandel CYL-HM21 is a general purpose portable four point probing system for measuring sheet resistance or volume resistivity.
