This is a general purpose portable four point probing system for measuring sheet resistance or volume resistivity.
RM3000+ Test Unit with PC Software
The RM3000+ Test Unit is a specialty electronics instruments designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement.
Multiposition Wafer Probe for the Measurement of Wafer Resistivity
The instrument comprises a white powder-paint coated metal base carrying a Delrin column supporting the vertical slide, operating lever shaft, and micro-switch. The vertical slide carries the probe head, secured by a clamp screw.
