The Jandel HM21-SRM Hand Held Meter with SRM Probe Head can accurately measure silicon tops and tails, potscrap, ingots, and homogeneous silicon wafers.
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other materials and conductive coatings.